Tag: HALT

Highly Accelerated Life Testing Procedures

Speeding up the process of device or circuit failure requires extreme inputs, those that are unlikely to occur during real-world use by customers regardless of the environment. Three common testing inputs are high and low temperatures, rapid cycling of the same and vibration along six-axes. In some cases, a highly accelerated life test (HALT) will incorporate combined temperature and vibration stresses. These inputs can result in component failure in the span of days, hours, or even minutes compared to months or years of typical usage.

Benefits of HALT Testing

While the percentages of failure based on the stress applied to a product can vary significantly, highly accelerated life testing can typically expose weaknesses faster than other means of testing. For example, of the above inputs, roughly two-thirds of failures will only come after the introduction of vibration alone or combined vibration and temperature tests. This means that during the product development process, a significant number of potential flaws would not be identified through testing that did not include these two stresses.