Constant Temperature Accelerated Life Testing using the Arrhenius Relationship

When products are mainly exposed to temperature stresses in the field, Constant Temperature Accelerated Life Testing is used to simulate product life. Products can be tested at temperatures above their normal use temperature during Constant Temperature Accelerated Life Testing in order to accelerate aging. Defects or failure modes that would show up after many years in the field at normal use temperatures can be detected in short times in an Accelerated Life Test. In Constant Temperature Accelerated Life Testing, the typical failure mode is dependent on migration/diffusion or chemical reactions. These types of failures are typically found in electronic components…