MIL-STD-810, Method 520 Combined Environments Testing is performed to evaluate the synergistic effects of temperature, altitude, humidity, input electrical power, and vibration on airborne electronic and electro-mechanical material. Combined environments testing is critical as it may induce failures that would not be exhibited during individual environment testing.
Additionally, the combined environments can amplify stresses, making this testing more reflective of real-world conditions than testing each environment separately. It’s important to note that MIL-STD-810 Combined Environments Method 520 is not intended as a replacement for methods 500, 501, 502, 507 and/or 514 unless specifically tailored and specified in customer requirements. The latest revision of the Combined Environments Test protocol is Method 520.5 from MIL-STD-810H.
DES is the right choice because we are a MIL-STD-810 accredited lab and will help you navigate through Method 520 Combined Environments testing.
Some of the Failures caused by Combined Environments are:
- Shattering of glass vials and optical material.
- Binding or loosening of moving parts.
- Separation of constituents.
- Performance degradation in electronic components due to parameter shifts.
- Electronic optical (fogging) or mechanical failures due to rapid water or frost formation.
- Differential contraction or expansion of dissimilar materials.
- Deformation or fracture of components.
- Cracking of surface coatings.
- Leakage of sealed compartments.
- Failure due to inadequate heat dissipation.
- If the material is powered, component over-temperature failures.
- Circuit Card Assembly failures due to short circuiting.
- Failure of Electromagnetic Interference (EMI) filters.
- Errors due to input electrical power frequency variances.
Method 520 Combined Environments has three Procedures
Note: It is recommended that single environment tests be performed prior to these procedures to verify system performance under discrete environmental parameters.
- Procedure I – Engineering Development. Procedure I is used to find design defects in new or modified equipment while it is still in the development stage. After anomalies are found, a root cause analysis is performed to determine the corrective action. Subsequent testing may be performed to aid in the root cause analysis. The subsequent tests may use higher stress levels than the product is likely to encounter on a regular basis in the field. Test durations are based on the time required to induce expected failure modes. This procedure is not a substitute for Environmental Stress Screening (ESS) or Highly Accelerated Life Testing (HALT).
- Procedure II – Flight or Mission Support. This procedure is performed in preparation for a specific mission scenario. It can also be used to troubleshoot field returned materiel exhibiting specific mission problems. The damage accumulation in Procedure II should be no faster than in normal operational or flight testing. Test durations should be the same as the design mission or, if troubleshooting, sufficient to identify materiel anomalies. This procedure is not intended to be used in lieu of Procedure III.
- Procedure III – Platform Envelope. The Platform Envelope test is intended to verify compliance with specific platform/equipment specifications. This testing utilizes the most significant combination of environmental stress conditions. A minimum test duration of 10 cycles is required.
Why Choose DES for MIL-STD-810 Combined Environments Testing
When it comes to MIL-STD-810 Combined Environments Testing, DES is uniquely qualified:
- DES has the experience to run MIL-STD-810 Method 520 Combined Environments tests .
- Our lab is A2LA accredited to MIL-STD-810.
- DES has state-of-the-art equipment to perform MIL-STD-810 comprehensive combined temperature, altitude, humidity testing and other combined environment tests.
- With extensive experience in Method 520 testing, DES ensures thorough evaluation and precise identification of potential failure modes.
Contact us today to discuss your MIL-STD-810 testing with one of our engineers.